By Gary E. McGuire,Yale E. Strausser
engineers operating with compound semiconductor fabrics and units who
are no longer characterization experts. fabrics and methods commonly used in
R&D and within the fabrication of GaAs, GaA1As, InP and HgCdTe established devices
provide examples of universal analytical difficulties. The e-book discusses a variety
of characterization options to supply perception into how each one individually,
or together, can be utilized in fixing difficulties linked to these
materials. The e-book may also help within the choice and alertness of the appropriate
analytical concepts by means of its insurance of all levels of fabrics or device
processing: substrate instruction, epitaxial progress, dielectric movie deposition,
contact formation and dopant introduction.
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